Samsung HD204UI, 2TB/R54/32M

From TechInfoDepot
Jump to navigationJump to search
Brand • Model • Rev
Samsung HD204UI 2TB/R54/32M
Interface
SATA II
Form factor
3.5"
Controler
Marvell 88i9122
Flash1 Size
? MiB
RAM1 Size
? MiB
RAM1 Chip
Samsung K4H561638N-LCCC
Vendor stated capacity: 2 TiB2,048 GiB <br />2,097,152 MiB <br />2,199.912 GB <br />2,199,912.448 MB <br />2,199,023,255,552 B <br />
Usable capacity: ? GiB
Other
Manuf/OEM/ODM

Additional chips
Spindle motor controller;Texas Instruments;SH6125B;SH6125B, 0AA6DDW, L A0114016, CU G4;1;

Retail
(Est.) release date December 2010
Country of manuf Korea

For a list of all currently documented Marvell chipsets with specifications, see Marvell.

Overview

The data in this entry is from a drive w/ a manuf. date of 2010.12.

<...>"4 S3M" and "REV.03 00" is etched onto the bottom later of the PCB by the SATA power connector.
  • Name: Samsung SpinPoint F4 EcoGreen (EG) Advanced Format (AF)
  • buggy firmware: [1]
  • fix for firmware here: (seagate website) [2]
Utility output
smartctl 5.39.1 2010-01-28 r3054 [i686-pc-linux-gnu] (openSUSE RPM) 
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net 

=== START OF INFORMATION SECTION === 
Device Model:     SAMSUNG HD204UI 
Serial Number:    S2H7JD2B222108 
Firmware Version: 1AQ10001 
User Capacity:    2,000,398,934,016 bytes 
Device is:        Not in smartctl database [for details use: -P showall] 
ATA Version is:   8 
ATA Standard is:  ATA-8-ACS revision 6 
Local Time is:    Tue Aug 20 01:40:42 2013 IST 
SMART support is: Available - device has SMART capability. 
SMART support is: Enabled 

=== START OF READ SMART DATA SECTION === 
SMART overall-health self-assessment test result: PASSED 

General SMART Values: 
Offline data collection status:  (0x00) Offline data collection activity 
                                        was never started. 
                                        Auto Offline Data Collection: Disabled. 
Self-test execution status:      (   0) The previous self-test routine completed 
                                        without error or no self-test has ever 
                                        been run. 
Total time to complete Offline 
data collection:                 (20640) seconds. 
Offline data collection 
capabilities:                    (0x5b) SMART execute Offline immediate. 
                                        Auto Offline data collection on/off support. 
                                        Suspend Offline collection upon new 
                                        command. 
                                        Offline surface scan supported. 
                                        Self-test supported. 
                                        No Conveyance Self-test supported. 
                                        Selective Self-test supported. 
SMART capabilities:            (0x0003) Saves SMART data before entering 
                                        power-saving mode. 
                                        Supports SMART auto save timer. 
Error logging capability:        (0x01) Error logging supported. 
                                        General Purpose Logging supported. 
Short self-test routine 
recommended polling time:        (   2) minutes. 
Extended self-test routine 
recommended polling time:        ( 255) minutes. 
SCT capabilities:              (0x003f) SCT Status supported. 
                                        SCT Feature Control supported. 
                                        SCT Data Table supported. 

SMART Attributes Data Structure revision number: 16 
Vendor Specific SMART Attributes with Thresholds: 
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE 
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       27165 
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0 
  3 Spin_Up_Time            0x0023   069   067   025    Pre-fail  Always       -       9508 
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       819 
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0 
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0 
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0 
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       17323 
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0 
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0 
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       834 
181 Program_Fail_Cnt_Total  0x0022   100   100   000    Old_age   Always       -       15790642 
191 G-Sense_Error_Rate      0x0022   252   252   000    Old_age   Always       -       0 
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0 
194 Temperature_Celsius     0x0002   057   051   000    Old_age   Always       -       43 (Lifetime Min/Max 15/49) 
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0 
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0 
197 Current_Pending_Sector  0x0032   252   100   000    Old_age   Always       -       0 
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0 
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0 
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       359 
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0 
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       838 

SMART Error Log Version: 1 
No Errors Logged 

SMART Self-test log structure revision number 1 
No self-tests have been logged.  [To run self-tests, use: smartctl -t] 


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run 
SMART Selective self-test log data structure revision number 0 
Note: revision number not 1 implies that no selective self-test has ever been run 
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS 
    1        0        0  Completed [00% left] (0-65535) 
    2        0        0  Not_testing 
    3        0        0  Not_testing 
    4        0        0  Not_testing 
    5        0        0  Not_testing 
Selective self-test flags (0x0): 
  After scanning selected spans, do NOT read-scan remainder of disk. 
If Selective self-test is pending on power-up, resume after 0 minute delay.